Investigation of Properties of Rare- Earth Elements Oxides as Gate Dielectric

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Abstract

The zirconium-doped lanthanum oxide nanocrystallites were prepared by a sol-gel method . In this work, the specified amounts of lanthanum nitrate hexahydrate, zirconium propoxide, acetic acid and 2-methoxy ethanol were dissolved and the obtained nanocrystallites were characterized by X-Ray Diffraction (XRD), Transmission Electron Microscopy (TEM) , Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) techniques. For measuring dielectric constant and electrical properties , tablets of zirconium-doped lanthanum oxide nanocrystallites were made and to study the optical properties of UV-Vis spectra were used . An optical band-gap of 3.92 eV has been measured from the transmittance spectroscopy experiments when the quantity of Zr in the oxide nanocrystallites has been 50% with annealing temperature 700 °C. The obtained size of nanoparticles by using X-powder is about 30 nm. Investigation was revealed that with doped zirconium occurs a surface structure homogeneous that leading to reducing leakage current.  

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References

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History

  • Receive Date: 26 February 2012
  • Revise Date: 02 May 2012
  • Accept Date: 01 July 2012

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