Measurement of wavelength, refractive index, plate thickness and dispersion coeffient by Fresnel diffraction, from transparent phase plate

Authors

tehran

Abstract

By illuminating the edge of transparent plate with a coherent quasimonochromatic
light, due to abrupt change in the refractive index at the
plate boundary, diffraction pattern is formed on a screen perpendicular
to the light propagation direction that can be described by the Fresnel-
Kirchhoff integrals. The visibility of fringes depends on the plate
thickness, refractive index, light incident angle and wavelength as the
visibility is a periodic function of incident angle. By varying incident
angle and counting the maximum of visibility repetition in two successive
angular intervals, the plate refractive index is obtained with four digits
meaningful without requiring the wavelength and the plate thickness. The
Cauchy and Sellmeier dispersion relation can be obtained by refractive
index measuring in some wavelengths. By knowing one wavelength, the
plate thickness and other wavelengths with four digits meaningful, in
micro meter regime, can be obtained. In this report the measurement of
refractive indices in two different thicknesses of fused-silica and soda
lime glass for He-Ne Laser, Nd-YAG Laser and four wavelengths of Argon
laser is done. The experiment has been done by modest instrumentation It
is shown that by using the high precision Goniometer and more sensitive CCD it is possible to measure the refractive indices, plate thickness and
wavelength with six digits meaningful.

Keywords


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